Showing 1 - 7 results of 7 for search 'Chsherbakov, Ivan', query time: 0.03s Refine Results
  1. 1
    Electron mobility-lifetime and resistivity mapping of GaAs:Cr wafers
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
  2. 2
    The influence of contact material and its fabrication on X-ray HR-GaAs:Cr sensor noise characteristics
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
  3. 3
    GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
  4. 4
    Characterisation of the HEXITEC4S X-ray spectroscopic imaging detector incorporating through-silicon via (TSV) technology
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
  5. 5
    Characterization of GaAs:Cr sensors using the charge-integrating JUNGFRAU readout chip
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
  6. 6
    High-spatial resolution measurements with a GaAs:Cr sensor using the charge integrating MÖNCH detector with a pixel pitch of 25 μm
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
  7. 7
    Characterization of chromium compensated gaas sensors with the charge-integrating JUNGFRAU readout chip by means of a highly collimated pencil beam
    Published in Sensors
    Other Authors: “...Chsherbakov, Ivan...”
    Get full text
    Перейти в каталог НБ ТГУ
    Article
Search Tools: Get RSS Feed