APA Цитирование

Moskovchenko, A., Švantner, M., Vavilov, V. P., & Chulkov, A. O. Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography. NDT & E International, 2022, .

Chicago-стиль цитирования

Moskovchenko, Alexey, Michal Švantner, Vladimir P. Vavilov, and Arsenii O. Chulkov. "Analyzing Probability of Detection as a Function of Defect Size and Depth in Pulsed IR Thermography." NDT & E International 2022 ().

MLA-цитирование

Moskovchenko, Alexey, et al. "Analyzing Probability of Detection as a Function of Defect Size and Depth in Pulsed IR Thermography." NDT & E International, 2022, .