Equilibrium concentration of kinks on the SB steps of the Si(100) surface
The temperature and time dependences of the concentration of kinks on the S-A and S-B steps perpendicular to the upper-terrace dimer rows on the Si(100) surface with an inclination of 0.5 degrees are established. The numbers of step kinks are determined from atomic-resolution scanning tunneling micr...
| Published in: | Journal of surface investigation: X-ray, synchrotron and neutron techniques Vol. 16, № 1. P. 140-144 |
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| Main Author: | |
| Other Authors: | , |
| Format: | Article |
| Language: | English |
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| Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001002743 Перейти в каталог НБ ТГУ |
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| 024 | 7 | |a 10.1134/S1027451022010220 |2 doi | |
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| 100 | 1 | |a Yesin, Michail Yu. |9 496654 | |
| 245 | 1 | 0 | |a Equilibrium concentration of kinks on the SB steps of the Si(100) surface |c M. Yu. Yesin, S. A. Teys, A. I. Nikiforov |
| 336 | |a Текст | ||
| 337 | |a электронный | ||
| 504 | |a Библиогр.: 23 назв. | ||
| 520 | 3 | |a The temperature and time dependences of the concentration of kinks on the S-A and S-B steps perpendicular to the upper-terrace dimer rows on the Si(100) surface with an inclination of 0.5 degrees are established. The numbers of step kinks are determined from atomic-resolution scanning tunneling microscopy images of the stepped Si(100) surface. It is shown that the temperature dependence of the number of kinks has a minimum at 650 degrees C. It is suggested that, at low temperatures, the steps are intensively smoothed (step kinks vanish), while at high temperatures, the step-destruction process (formation of a great number of step kinks) is more intensive. The step smoothing and destruction processes include a sequence of atom and dimer elementary acts. As the annealing time increases, the kink concentration decreases and takes a constant value. The equilibrium step-kink concentration is shown to be determined by the surface annealing temperature and time. | |
| 653 | |a сканирующая туннельная микроскопия | ||
| 653 | |a температурная зависимость | ||
| 653 | |a ступенчатые изломы | ||
| 655 | 4 | |a статьи в журналах |9 887509 | |
| 700 | 1 | |a Teys, Sergey A. |9 897143 | |
| 700 | 1 | |a Nikiforov, Alexander I. |9 95710 | |
| 773 | 0 | |t Journal of surface investigation: X-ray, synchrotron and neutron techniques |d 2022 |g Vol. 16, № 1. P. 140-144 |x 1027-4510 | |
| 852 | 4 | |a RU-ToGU | |
| 856 | 4 | |u http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001002743 | |
| 856 | |y Перейти в каталог НБ ТГУ |u https://koha.lib.tsu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=1002743 | ||
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