STM/STS study of the density of states and contrast behavior at the boundary between (7х7)N and (8х8) structures in the SiN/Si(111) system

The origin of the contrast appearing in STM images at the boundary between diverse ordered structures is studied using the example of two structures, (7 × 7)N and (8 × 8), formed in the system of a two-dimensional silicon nitride layer on the Si(111) surface during ammonia nitridation. A significant...

Full description

Bibliographic Details
Published in:Crystals Vol. 12, № 12. P. 1707 (1-23)
Other Authors: Mansurov, Vladimir, Malin, Timur, Teys, Sergey A., Atuchin, Victor V., Milakhin, Denis, Zhuravlev, Konstantin
Format: Article
Language:English
Subjects:
Online Access:http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001008407
LEADER 02729nab a2200385 c 4500
001 koha001008407
005 20231030132648.0
007 cr |
008 231020|2022 sz s a eng d
024 7 |a 10.3390/cryst12121707  |2 doi 
035 |a koha001008407 
040 |a RU-ToGU  |b rus  |c RU-ToGU 
245 1 0 |a STM/STS study of the density of states and contrast behavior at the boundary between (7х7)N and (8х8) structures in the SiN/Si(111) system  |c V. Mansurov, T. Malin, S. Teys [et al.] 
336 |a Текст 
337 |a электронный 
504 |a Библиогр.: 53 назв. 
520 3 |a The origin of the contrast appearing in STM images at the boundary between diverse ordered structures is studied using the example of two structures, (7 × 7)N and (8 × 8), formed in the system of a two-dimensional silicon nitride layer on the Si(111) surface during ammonia nitridation. A significant dependence of the contrast between these structures on the voltage applied to the tunnel gap was found and studied both experimentally and theoretically. Variations in the contrast were quantitatively studied in the range from −3 V to +3 V, and they were studied in more detail for the positive biases on the sample from +1 V to +2.5 V, where the contrast was changed more than 2 times. Within the one-dimensional Wentzel–Kramers–Brillouin (WKB) model for the tunnel current, a comparatively simple procedure is proposed for the correction of the experimental STS-spectra of differential conductivity to identify the adequate (feasible) density of electron states (DOS). It is shown that the (8 × 8) structure DOS corresponds to a graphene-like layer of silicon nitride structure. The proposed correction procedure of the empirical differential conductivity spectra measured by STS will be useful for the quantitative determination of the DOS of new two-dimensional materials and surface structures. 
653 |a нитрид кремния 
653 |a 2D материалы 
653 |a кремниевая поверхность 
653 |a азотирование 
653 |a квазиклассическое приближение 
653 |a дифференциальная проводимость 
655 4 |a статьи в журналах 
700 1 |a Mansurov, Vladimir 
700 1 |a Malin, Timur 
700 1 |a Teys, Sergey A. 
700 1 |a Atuchin, Victor V. 
700 1 |a Milakhin, Denis 
700 1 |a Zhuravlev, Konstantin 
773 0 |t Crystals  |d 2022  |g Vol. 12, № 12. P. 1707 (1-23)  |x 2073-4352 
852 4 |a RU-ToGU 
856 4 |u http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001008407 
908 |a статья 
999 |c 1008407  |d 1008407