The formation of structural imperfections in semiconductor silicon

"Today, it is difficult to imagine all spheres of human activity without personal computers, solid-state electronic devices, micro- and nanoelectronics, photoconverters, and mobile communication devices. The basic material of modern electronics and for all of these industries is semiconductor s...

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Bibliographic Details
Main Author: Talanin, V. I. (Vitaliĭ Igorʹevich)
Other Authors: Talanin, I. E. (Igor Evgenievich)
Format: eBook
Language:English
Published: Newcastle upon Tyne, UK Cambridge Scholars Publishing, 2018.
Subjects:
Online Access:https://www.lib.tsu.ru/mminfo/2023/EBSCO/1986604.pdf
Table of Contents:
  • Chapter one. Growth of dislocation-free silicon single crystals from melt and defect formation
  • Chapter two. Physical modeling of defect formation processes in dislocation-free single crystals of silicon
  • Chapter three. Physical basis of a heterogenous (two-stage) model of grown-in microdefect formation
  • Chapter four. High-temperature precipitation of impurity in dislocation-free silicon single crystals
  • Chapter five. The formation of microvoids and interstitial dislocation loops during crystal cooling after growing
  • Chapter six. General approach to the engineering of defects in semiconductor silicon.