Algorithm for optimizing the parameters of sandwich X-ray detectors

We describe an algorithm for optimizing the parameters of sandwich X-ray detectors in relation to the recognition of materials by the dual energy method. The application of the algorithm is illustrated by a concrete example in which we obtain the thicknesses of the first detector and the intermediat...

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Библиографическая информация
Опубликовано в: :Russian journal of nondestructive testing Vol. 59, № 3. P. 359-373
Главный автор: Udod, Victor A.
Другие авторы: Osipov, Sergei P., Nazarenko, Svetlana Yu
Формат: Статья в журнале
Язык:English
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Online-ссылка:http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001017566