Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /
| Published in: | Springer e-books |
|---|---|
| Main Author: | Kalinin, Sergei |
| Corporate Author: | SpringerLink (Online service) |
| Other Authors: | Gruverman, Alexei |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer Science+Business Media, LLC,
2007.
|
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1007/978-0-387-28668-6 Перейти в каталог НБ ТГУ |
Similar Items
-
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /
by: Foster, Adam
Published: (2006) -
Surface Microscopy with Low Energy Electrons
by: Bauer, Ernst
Published: (2014) -
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques /
by: Bhushan, Bharat
Published: (2007) -
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques /
by: Bhushan, Bharat
Published: (2009) -
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques /
by: Bhushan, Bharat
Published: (2008)
