Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

Библиографическая информация
Опубликовано в: :	Springer e-books
Главный автор:	Kalinin, Sergei
Соавтор:	SpringerLink (Online service)
Другие авторы:	Gruverman, Alexei
Формат:	Электронная книга
Язык:	English
Публикация:	New York, NY : Springer Science+Business Media, LLC, 2007.
Предметы:	Mechanical engineering Microscopy Nanotechnology Particles (Nuclear physics) Surfaces (Physics) chemistry Biological Microscopy Characterization and Evaluation of Materials Mechanical Engineering Solid State Physics and Spectroscopy Surfaces and Interfaces, Thin Films
Online-ссылка:	http://dx.doi.org/10.1007/978-0-387-28668-6 Перейти в каталог НБ ТГУ

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