Microscopy of Semiconducting Materials 2007

Microscopy of Semiconducting Materials 2007

Библиографическая информация
Опубликовано в: :	Springer eBooks
Главный автор:	Cullis, A. G.
Соавтор:	SpringerLink (Online service)
Другие авторы:	Midgley, P. A.
Формат:	Электронная книга
Язык:	English
Публикация:	Dordrecht : Springer Netherlands, 2008.
Серии:	Springer Proceedings in Physics,
Предметы:	electronics Particles (Nuclear physics) Weights and measures Material Science Electronics and Microelectronics, Instrumentation Materials Science, general Measurement Science, Instrumentation Solid State Physics and Spectroscopy
Online-ссылка:	http://dx.doi.org/10.1007/978-1-4020-8615-1 Перейти в каталог НБ ТГУ

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