VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers /

VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers /

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI c...

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Bibliographic Details
Published in:Springer eBooks
Corporate Author: SpringerLink (Online service)
Other Authors: Gaur, Manoj Singh (Editor), Zwolinski, Mark (Editor), Laxmi, Vijay (Editor), Boolchandani, Dharmendra (Editor), Sing, Virendra (Editor), Sing, Adit D. (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Series:Communications in Computer and Information Science,
Subjects:
Computer Science.
Computer hardware.
Computer Communication Networks.
Computer Hardware.
Processor Architectures.
Online Access:http://dx.doi.org/10.1007/978-3-642-42024-5
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Description
Summary:This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Physical Description:XVI, 388 p. 246 illus. online resource.
ISBN:9783642420245
ISSN:1865-0929 ;

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