Design for Manufacturability From 1D to 4D for 90-22 nm Technology Nodes /

This book explains integrated circuit design for manufacturability (DfM) at the product level (packaging, applications) and applies engineering DfM principles to the latest standards of product development at 22 nm technology nodes.  It is a valuable guide for layout designers, packaging engineers a...

Полное описание

Библиографическая информация
Опубликовано в: :Springer eBooks
Главный автор: Balasinski, Artur (Автор)
Соавтор: SpringerLink (Online service)
Формат: Электронная книга
Язык:English
Публикация: New York, NY : Springer New York : Imprint: Springer, 2014.
Предметы:
Online-ссылка:http://dx.doi.org/10.1007/978-1-4614-1761-3
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Оглавление:
  • Preface
  • Classic DfM: from 2D to 3D
  • DfM at 28 nm and Beyond
  • New DfM Domain: Stress Effects
  • Conclusions and Future Work.