Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, ano...
| Published in: | Springer eBooks |
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| Format: | eBook |
| Language: | English |
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New York, NY :
Springer New York : Imprint: Springer,
2014.
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| Online Access: | http://dx.doi.org/10.1007/978-1-4614-7909-3 Перейти в каталог НБ ТГУ |
Table of Contents:
- Introduction
- Characterization, Experimental Challenges
- Advanced Characterization
- Characterization of Nanoscale Devices
- Statistical Properties/Variability
- Theoretical Understanding
- Possible Defects: Experimental
- Possible Defects: First Principles
- Modeling
- Technological Impact
- Silicon dioxides/SiON
- High-k oxides
- Alternative technologies
- Circuits.