Counterfeit Integrated Circuits Detection and Avoidance /

This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade.  The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs)...

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Bibliographic Details
Published in:Springer eBooks
Main Authors: Tehranipoor, Mark (Mohammad) (Author), Guin, Ujjwal (Author), Forte, Domenic (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2015.
Subjects:
Online Access:http://dx.doi.org/10.1007/978-3-319-11824-6
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LEADER 03448nam a22004935i 4500
001 vtls000558133
003 RU-ToGU
005 20210922085706.0
007 cr nn 008mamaa
008 170212s2015 gw | s |||| 0|eng d
020 |a 9783319118246  |9 978-3-319-11824-6 
024 7 |a 10.1007/978-3-319-11824-6  |2 doi 
035 |a to000558133 
039 9 |y 201702122142  |z Александр Эльверович Гилязов 
040 |a Springer  |c Springer  |d RU-ToGU 
050 4 |a TK7888.4 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
082 0 4 |a 621.3815  |2 23 
100 1 |a Tehranipoor, Mark (Mohammad).  |e author.  |9 464720 
245 1 0 |a Counterfeit Integrated Circuits  |h electronic resource  |b Detection and Avoidance /  |c by Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte. 
260 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2015.  |9 742221 
300 |a XX, 269 p. 134 illus., 109 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
505 0 |a Introduction -- Conterfeit Integrated Circuits -- Counterfeit Defects -- Physical Tests for Counterfeit Detection -- Electrical Tests for Counterfeit Detection -- Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods -- Advanced Detection: Physical Tests -- Advanced Detection: Electrical Tests -- Combating Die and IC Recycling -- Hardware IP Watermarking -- Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly -- Chip ID. 
520 |a This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade.  The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs).  Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat.   ·      Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; ·      Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; ·      Provides step-by-step solutions for detecting different types of counterfeit ICs; ·      Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government. 
650 0 |a engineering.  |9 224332 
650 0 |a Microprocessors.  |9 460327 
650 0 |a Electronic circuits.  |9 460329 
650 1 4 |a Engineering.  |9 224332 
650 2 4 |a Circuits and Systems.  |9 303075 
650 2 4 |a Processor Architectures.  |9 303114 
650 2 4 |a Electronic Circuits and Devices.  |9 410654 
700 1 |a Guin, Ujjwal.  |e author.  |9 464721 
700 1 |a Forte, Domenic.  |e author.  |9 464722 
710 2 |a SpringerLink (Online service)  |9 143950 
773 0 |t Springer eBooks 
856 4 0 |u http://dx.doi.org/10.1007/978-3-319-11824-6 
856 |y Перейти в каталог НБ ТГУ  |u https://koha.lib.tsu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=413452 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647) 
999 |c 413452  |d 413452