Charge carrier transport and deep levels recharge in avalanche s-diodes based on GaAs

Carrier transport and deep-level recharging in semiconductor avalanche S-diode structures have been investigated. Gallium-arsenide n+-π-ν-n structures with the diffusion distribution of deep iron acceptors have been studied. It has been found by solving the continuity and Poisson equations with the...

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Bibliographic Details
Published in:Technical physics letters Vol. 44, № 6. P. 465-468
Other Authors: Verkholetov, Maksim G., Koroleva, A. D., Tolbanov, Oleg P., Prudaev, Ilya A.
Format: Article
Language:English
Subjects:
Online Access:http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000658437
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245 1 0 |a Charge carrier transport and deep levels recharge in avalanche s-diodes based on GaAs  |c I. A. Prudaev, M. G. Verkholetov, A. D. Koroleva, O. P. Tolbanov 
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520 3 |a Carrier transport and deep-level recharging in semiconductor avalanche S-diode structures have been investigated. Gallium-arsenide n+-π-ν-n structures with the diffusion distribution of deep iron acceptors have been studied. It has been found by solving the continuity and Poisson equations with the use of a commercial software that the electron injection affects the avalanche breakdown voltage and the spacecharge region broadens due to capture of avalanche holes on negative iron ions in the π-region. It is demonstrated by comparing the results of numerical calculation with the experimental data that the S-shaped I-V characteristic of the diffusion avalanche S-diodes cannot be explained within the previously proposed mechanism of capture of avalanche holes on the deep iron levels. 
653 |a лавинные S-диоды 
653 |a уравнение непрерывности 
653 |a транспорт носителей заряда 
653 |a перезарядка глубоких уровней 
655 4 |a статьи в журналах  |9 879358 
700 1 |a Verkholetov, Maksim G.  |9 491990 
700 1 |a Koroleva, A. D.  |9 496552 
700 1 |a Tolbanov, Oleg P.  |9 95834 
700 1 |a Prudaev, Ilya A.  |9 99979 
773 0 |t Technical physics letters  |d 2018  |g Vol. 44, № 6. P. 465-468  |x 1063-7850 
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