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Parameter identification method for dual-energy X-ray imaging
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Review of pulsed thermal NDT: Physical principles, theory and data processing
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Vavilov, Vladimir P.
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Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography
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Burleigh, Douglas D.
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Chakhlov, Sergey V
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Chulkov, Arsenii O.
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Libin, Eduard E.
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Švantner, Michal
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Томский государственный университет Механико-математический факультет Кафедра физической и вычислительной механики
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