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Helium Ion Microscopy Principles and Applications /
by
Joy
,
David
C
.
Published in
Springer eBooks
(2013)
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Related Subjects
Characterization and Evaluation of Materials
Materials Science
Nanoscale Science and Technology
Nanotechnology
Spectroscopy
Spectroscopy and Microscopy
Spectroscopy/Spectrometry
Surfaces (Physics)
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