Showing 1 - 5 results of 5 for search 'Panin, Alexey V.', query time: 0.02s Refine Results
  1. 1
    Measuring device for design and quality inspection of thin films and multi-layered structures for microelectronics
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    Book Chapter
  2. 2
    The effect of crystallographic grain orientation of polycrystalline Ti on ploughing under scratch testing
    Published in Wear
    Other Authors: “...Panin, Alexey V....”
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    Article
  3. 3
    Numerical study of atomic scale deformation mechanisms of Ti grains with different crystallographic orientation subjected to scratch testing
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    Article
  4. 4
    Improvement of mechanical properties and adhesion of Ti-Al-Si-N coatings by alloying with Ta
    Published in Lubricants
    Other Authors: “...Panin, Alexey V....”
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    Article
  5. 5
    New generation of sensors based on nanostructured materials
    Other Authors: “...Panin, Alexey V....”
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    Book Chapter
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