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    Investigation of the bimodal character of RHEED intensity oscillations during homoepitaxial growth of Si/Si(100)
    Investigation of the bimodal character of RHEED intensity oscillations during homoepitaxial growth of Si/Si(100)
    by Sokolov, А. S.
    Published in Двадцатая Всероссийская конференция студенческих научно-исследовательских инкубаторов, г. Томск, 2–5 мая 2023 г.
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