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Rietveld refinement practical pattern analysis using TOPAS

Rietveld refinement practical pattern analysis using TOPAS

Bibliographic Details
Main Author: Dinnebier, Robert E.
Corporate Author: ProQuest (Firm)
Format: eBook
Language:English
Published: Berlin ; Boston De Gruyter, [2019]
Subjects:
Rietveld method.
X-rays > Diffraction.
Crystallography.
EBSCO eBooks
Online Access:https://www.lib.tsu.ru/mminfo/2023/EBSCO/2018175.pdf
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Internet

https://www.lib.tsu.ru/mminfo/2023/EBSCO/2018175.pdf
Перейти в каталог НБ ТГУ

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