Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra

This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spec...

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Bibliographic Details
Main Author: Mikhailov, Igor F.
Other Authors: Baturin, Alexey A., Mikhailov, Anton I.
Format: eBook
Language:English
Published: Newcastle-upon-Tyne Cambridge Scholars Publisher, 2020.
Subjects:
Online Access:https://www.lib.tsu.ru/mminfo/2023/EBSCO/2329686.pdf