Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra

This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spec...

Полное описание

Библиографическая информация
Главный автор: Mikhailov, Igor F.
Другие авторы: Baturin, Alexey A., Mikhailov, Anton I.
Формат: Электронная книга
Язык:English
Публикация: Newcastle-upon-Tyne Cambridge Scholars Publisher, 2020.
Предметы:
Online-ссылка:https://www.lib.tsu.ru/mminfo/2023/EBSCO/2329686.pdf