Microplasma breakdown in GaAs-based avalanche S-diodes doped with deep Fe acceptors
The article reports investigations into the microplasma breakdown in GaAs-based avalanche S-diodes doped with deep Fe acceptor impurities. The experiment shows the effect of current limitation in a reverse I-V curve with "soft" avalanche breakdown. It proposes 2D single microplasma models...
Published in: | Physica status solidi B Vol. 260, № 4. P. 2200446 (1-7) |
---|---|
Main Author: | |
Other Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001017184 Перейти в каталог НБ ТГУ |