Microplasma breakdown in GaAs-based avalanche S-diodes doped with deep Fe acceptors

The article reports investigations into the microplasma breakdown in GaAs-based avalanche S-diodes doped with deep Fe acceptor impurities. The experiment shows the effect of current limitation in a reverse I-V curve with "soft" avalanche breakdown. It proposes 2D single microplasma models...

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Bibliographic Details
Published in:Physica status solidi B Vol. 260, № 4. P. 2200446 (1-7)
Main Author: Prudaev, Ilya A.
Other Authors: Kopyev, Viktor V., Oleinik, Vladimir L.
Format: Article
Language:English
Subjects:
Online Access:http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001017184
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