Microplasma breakdown in GaAs-based avalanche S-diodes doped with deep Fe acceptors
The article reports investigations into the microplasma breakdown in GaAs-based avalanche S-diodes doped with deep Fe acceptor impurities. The experiment shows the effect of current limitation in a reverse I–V curve with “soft” avalanche breakdown. It proposes 2D single microplasma models and calcul...
| Опубликовано в: : | Physica status solidi B Vol. 260, № 4. P. 2200446 (1-7) |
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| Главный автор: | |
| Другие авторы: | , |
| Формат: | Статья в журнале |
| Язык: | English |
| Предметы: | |
| Online-ссылка: | http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:001017184 |