Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Bibliographic Details
Published in:Springer e-books
Main Author: Yeung, Dit-Yan
Corporate Author: SpringerLink (Online service)
Other Authors: de Ridder, Dick, Fred, Ana, Kwok, James T., Roli, Fabio
Format: eBook
Language:English
Published: Berlin Heidelberg : Springer-Verlag GmbH., 2006
Series:Lecture Notes in Computer Science,
Subjects:
Artificial intelligence
Computational complexity
Computer graphics
Computer vision
Optical pattern recognition
Computer Science
Artificial Intelligence (incl. Robotics)
Computer Graphics
Discrete Mathematics in Computer Science
Image Processing and Computer Vision
Pattern Recognition
Online Access:http://dx.doi.org/10.1007/11815921
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Internet

http://dx.doi.org/10.1007/11815921
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