Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Bibliographic Details
Published in:Springer e-books
Main Author: Yeung, Dit-Yan
Corporate Author: SpringerLink (Online service)
Other Authors: de Ridder, Dick, Fred, Ana, Kwok, James T., Roli, Fabio
Format: eBook
Language:English
Published: Berlin Heidelberg : Springer-Verlag GmbH., 2006
Series:Lecture Notes in Computer Science,
Subjects:
Online Access:http://dx.doi.org/10.1007/11815921
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