Parallel algorithm for constructing k-valued fault-tolerant diagnostic tests in intelligent systems
Published in: | Pattern recognition and image analysis Vol. 22, № 3. P. 473-482 |
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Format: | Article |
Language: | English |
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Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000444664 Перейти в каталог НБ ТГУ |