Atom Probe Microscopy
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and puls...
| Published in: | Springer eBooks |
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| Main Authors: | , , , |
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
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| Series: | Springer Series in Materials Science,
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| Subjects: | |
| Online Access: | http://dx.doi.org/10.1007/978-1-4614-3436-8 Перейти в каталог НБ ТГУ |