A high performance scan flip-flop design for serial and mixed mode scan test
| Published in: | 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain P. 233-238 |
|---|---|
| Other Authors: | , , , |
| Format: | Book Chapter |
| Language: | English |
| Subjects: | |
| Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000616264 Перейти в каталог НБ ТГУ |