On the fault coverage of high-level test derivation methods for digital circuits
Testing digital circuits is crucial for guaranteeing the correct and reliable functioning of electronic devices. Deriving high quality test suites to check the correctness of such devices is an important task. To estimate the quality of a test suite, a common approach is to simulate faults in a give...
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| Format: | Book Chapter |
| Language: | English |
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| Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000632164 Перейти в каталог НБ ТГУ |