Investigation of dual-ion beam sputter-instigated plasmon generation in TCOs: a case study of GZO

The use of the high free-electron concentration in heavily doped semiconductor enables the realization of plasmons. We report a novel approach to generate plasmons in Ga:ZnO (GZO) thin films in the wide spectral range of ∼1.87-10.04 eV. In the grown GZO thin films, dual-ion beam sputtering (DIBS) in...

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Bibliographic Details
Published in:ACS Applied materials & interfaces Vol. 10, № 6. P. 5464-5474
Other Authors: Sengar, Brajendra S., Awasthi, Vishnu, Kumar, Amitesh, Singh, Rohit, Kumar, Shailendra, Mukherjee, C., Atuchin, Victor V., Mukherjee, Shaibal, Garg, Vivek
Format: Article
Language:English
Subjects:
Online Access:http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000658490
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024 7 |a 10.1021/acsami.7b15103  |2 doi 
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039 9 |a 201906131718  |c 201906071827  |d VLOAD  |y 201906071814  |z Александр Эльверович Гилязов 
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245 1 0 |a Investigation of dual-ion beam sputter-instigated plasmon generation in TCOs: a case study of GZO  |c V. Garg, B. S. Sengar, V. Awasthi [et al.] 
520 3 |a The use of the high free-electron concentration in heavily doped semiconductor enables the realization of plasmons. We report a novel approach to generate plasmons in Ga:ZnO (GZO) thin films in the wide spectral range of ∼1.87-10.04 eV. In the grown GZO thin films, dual-ion beam sputtering (DIBS) instigated plasmon is observed because of the formation of different metallic nanoclusters are reported. Moreover, formation of the nanoclusters and generation of plasmons are verified by field emission scanning electron microscope, electron energy loss spectra obtained by ultraviolet photoelectron spectroscopy, and spectroscopic ellipsometry analysis. Moreover, the calculation of valence bulk, valence surface, and particle plasmon resonance energies are performed, and indexing of each plasmon peaks with corresponding plasmon energy peak of the different nanoclusters is carried out. Further, the use of DIBS-instigated plasmon-enhanced GZO can be a novel mean to improve the performance of photovoltaic, photodetector, and sensing devices. 
653 |a плазмоны 
653 |a тонкие пленки 
653 |a нанокластеры 
653 |a ультрафиолетовая фотоэлектронная спектроскопия 
655 4 |a статьи в журналах  |9 879358 
700 1 |a Sengar, Brajendra S.  |9 496484 
700 1 |a Awasthi, Vishnu  |9 496481 
700 1 |a Kumar, Amitesh  |9 496480 
700 1 |a Singh, Rohit  |9 496531 
700 1 |a Kumar, Shailendra  |9 496482 
700 1 |a Mukherjee, C.  |9 496532 
700 1 |a Atuchin, Victor V.  |9 95830 
700 1 |a Mukherjee, Shaibal  |9 496483 
700 1 |a Garg, Vivek  |9 496479 
773 0 |t ACS Applied materials & interfaces  |d 2018  |g Vol. 10, № 6. P. 5464-5474  |x 1944-8244 
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