Testing digital circuits: studying the increment of the number of states and estimating the fault coverage
Testing of digital circuits is very important, especially for guaranteeing the correct and reliable functioning of electronic devices. One of the possibilities for deriving high quality test suites is using test generation methods for a corresponding Finite State Machine simulating the circuit b...
| Опубликовано в: : | 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2018), Erlagol, Altai Republic, 29 June - 3 July, 2018 : proceedings P. 220-224 |
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| Другие авторы: | , , , |
| Формат: | Статья в сборнике |
| Язык: | English |
| Предметы: | |
| Online-ссылка: | http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000659775 Перейти в каталог НБ ТГУ |