Near-field interference microwave diagnostics of cultural plants and wood materials

A schematic solution of the near-field interference microwave microscopy technology is discussed. This solution is implemented in the form of a maximally simplified microscope structure. Testing was con-ducted to determine the capabilities of this microscope. It is shown that technology can be used...

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Bibliographic Details
Published in:MATEC Web of conferences Vol. 155. P. 01021 (1-6)
Main Author: Belichenko, Viktor P.
Other Authors: Zapasnoy, Andrey S., Mironchev, Aleksandr S.
Format: Article
Language:English
Subjects:
Online Access:http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000659508
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