C60 capping of metallic 2D Tl-Au compound with preservation of its basic properties at the buried interface

So-called metal-induced silicon reconstructions (i.e., metal films of monolayer or submonolayer thickness epitaxially grown on single-crystal silicon substrates in ultra-high vacuum) represent a specific class of low-dimensional advanced materials with potential prospects for electronic and spintron...

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Bibliographic Details

Published in:	Applied surface science Vol. 501. P. 144253 (1-7)
Other Authors:	Mararov, V. V., Utas, T. V., Bondarenko, Leonid V., Tupchaya, Alexandra Yu, Matetskiy, Andrey V., Denisov, N. V., Mihalyuk, Alexey N., Eremeev, Sergey V., Gruznev, Dimitry V., Olyanich, D. A., Zotov, Andrey V., Saranin, Alexander A.
Format:	Article
Language:	English
Subjects:	кремний фуллерены атомная структура электронная структура статьи в журналах
Online Access:	http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000791599 Перейти в каталог НБ ТГУ