BDD and DNF based algorithms for constructing all testability functions of combinational circuit
Constructing testability functions of a combinational circuit line, such as: the controllability, observability and stuck-at fault detection functions, as well as the complement of the observability function is considered. Methods and algorithms for constructing testability functions based on Binary...
| Опубликовано в: : | International Siberian Conference on Control and Communications, May 13-15, 2021, Kazan, Russia P. [1-6] |
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| Главный автор: | |
| Формат: | Статья в сборнике |
| Язык: | English |
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| Online-ссылка: | http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000891951 Перейти в каталог НБ ТГУ |