X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors

A newly supplied 80 × 80 chromium compensated GaAs sensor with a matrix of 80 × 80 pixels on a 250 m pixel pitch has been characterised utilising microbeam mapping techniques at the Diamond Light Source. The GaAs:Cr sensor was mounted to a HEXITEC DAQ system before raster scanning an X-ray beam with...

Full description

Bibliographic Details

Published in:	Nuclear instruments and methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment Vol. 999. P. 165207 (1-7)
Other Authors:	Wheater, R. M., Jowitt, L., Zarubin, Andrei N., Richards, S., Veale, Matthew C., Wilson, Matthew D., Fox, O. J. L., Sawhney, K. J. S., Lozinskaya, Anastassiya D., Shemeryankina, A., Tolbanov, Oleg P., Tyazhev, Anton V.
Format:	Article
Language:	English
Subjects:	арсенид-галлиевые детекторы методы визуализации статьи в журналах
Online Access:	http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000892894 Перейти в каталог НБ ТГУ