Impact on the subsurface layers of the single-crystal β-Ga2O3 wafers induced by a mechanical wear

The tribological experiment applied to the gallium oxide wafer led to changes in its structure which can reduce the single crystal perfection. The effect of mechanical wear on the subsurface layers of the β-Ga2O3 single crystal wafers applied to the plane is studied. A decrease in crystallinity with...

Полное описание

Библиографическая информация
Опубликовано в: :Materials science in semiconductor processing Vol. 143. P. 106520 (1-6)
Другие авторы: Butenko, Pavel N., Guzilova, Lyubov I., Chikiryaka, Andrei V., Boiko, V. I., Sharkov, M. D., Almaev, Aleksei V., Nikolaev, Vladimir I.
Формат: Статья в журнале
Язык:English
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Online-ссылка:http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000997190
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