Helium Ion Microscopy Principles and Applications /
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century. Topics covered includ...
| Опубликовано в: : | Springer eBooks |
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| Главный автор: | |
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| Формат: | Электронная книга |
| Язык: | English |
| Публикация: |
New York, NY :
Springer New York : Imprint: Springer,
2013.
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| Серии: | SpringerBriefs in Materials,
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| Online-ссылка: | http://dx.doi.org/10.1007/978-1-4614-8660-2 Перейти в каталог НБ ТГУ |