Electro-physical characteristics of MIS structures with HgTe-based single quantum wells for optoelectronics devices

The paper presents brief research results of the admittance of metal-insulator- semiconductor (MIS) structures based on Hg1-xCdxTe grown by molecular-beam epitaxy (MBE) method including single HgCdTe/HgTe/HgCdTe quantum wells (QW) in the surface layer. The thickness of a quantum well was 5.6 nm, and...

Полное описание

Библиографическая информация
Опубликовано в: :Journal of Physics: Conference Series Vol. 735. P. 012012 (1-5)
Другие авторы: Dzyadukh, Stanislav M., Voytsekhovskiy, Alexander V., Gorn, Dmitriy Igorevich, Nesmelov, Sergey N.
Формат: Статья в журнале
Язык:English
Предметы:
Online-ссылка:http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000622054
Перейти в каталог НБ ТГУ
LEADER 02194nab a2200349 c 4500
001 vtls000622054
003 RU-ToGU
005 20230319212139.0
007 cr |
008 180301|2016 enk s a eng d
024 7 |a 10.1088/1742-6596/735/1/012012  |2 doi 
035 |a to000622054 
039 9 |a 201803020956  |c 201803011440  |d VLOAD  |y 201803011423  |z Александр Эльверович Гилязов 
040 |a RU-ToGU  |b rus  |c RU-ToGU 
245 1 0 |a Electro-physical characteristics of MIS structures with HgTe-based single quantum wells for optoelectronics devices  |c S. Dzyadukh, S. Nesmelov, A. Voytsekhovskiy, D. Gorn 
504 |a Библиогр.: 4 назв. 
520 3 |a The paper presents brief research results of the admittance of metal-insulator- semiconductor (MIS) structures based on Hg1-xCdxTe grown by molecular-beam epitaxy (MBE) method including single HgCdTe/HgTe/HgCdTe quantum wells (QW) in the surface layer. The thickness of a quantum well was 5.6 nm, and the composition of barrier layers with the thickness of 35 nm was close to 0.65. Measurements were conducted in the range of temperatures from 8 to 200 K. It is shown that for structure with quantum well based on HgTe capacitance and conductance oscillations in the strong inversion are observed. Also it is assumed these oscillations are related with the recharging of quantum levels in HgTe. 
653 |a квантовые ямы 
653 |a оптоэлектронные устройства 
653 |a адмиттанс 
653 |a МДП-структуры 
655 4 |a статьи в журналах  |9 879358 
700 1 |a Dzyadukh, Stanislav M.  |9 95711 
700 1 |a Voytsekhovskiy, Alexander V.  |9 91706 
700 1 |a Gorn, Dmitriy Igorevich  |9 167622 
700 1 |a Nesmelov, Sergey N.  |9 101528 
773 0 |t Journal of Physics: Conference Series  |d 2016  |g Vol. 735. P. 012012 (1-5)  |x 1742-6588 
852 4 |a RU-ToGU 
856 7 |u http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000622054 
856 |y Перейти в каталог НБ ТГУ  |u https://koha.lib.tsu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=431425 
908 |a статья 
999 |c 431425  |d 431425