Admittance characterization of pentacene metal-insulator-semiconductor capacitors with SiO2 and SiO2/Ga2O3 insulators in temperature range of 9-300 K
Pentacene-based metal-insulator-semiconductor capacitors with SiO2 and SiO2/Ga2O3 insulators were investigated in the temperature range of 9-300 K. The capacitance-voltage curves of the fabricated capacitors had virtually no hysteresis when using SiO2 as an insulator. The hole concentration values,...
Published in: | Thin solid films Vol. 692. P. 137622 (1-7) |
---|---|
Other Authors: | Nesmelov, Sergey N., Novikov, Vadim A., Dzyadukh, Stanislav M., Kopylova, Tatyana N., Ivonin, Ivan V., Degtyarenko, Konstantin M., Tereshchenko, Evgeny V., Voytsekhovskiy, Alexander V. |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000791081 Перейти в каталог НБ ТГУ |
Similar Items
- Admittance of pentacene-based MIS-structures with two-layer insulator SiO2-Al2O3
- Electrophysical characteristics of the pentacene-based MIS structures with a SiO2 insulator
- Электрофизические характеристики МДП-структур на основе пентацена с диэлектриком SiO2
- Адмиттанс МДП-структур на основе пентацена с двухслойным диэлектриком SiO2-Al2O3
- Электрические свойства органо-неорганических систем на основе пентацена с двухслойным диэлектриком SiO2-Al2O3