Nano‑scale structural studies of defects in arsenic‑implanted n and p‑type HgCdTe films
Bright-feld and high-resolution transmission electron microscopy were used for nano-scale structural studies of defects induced by implantation of arsenic ions with 190 keV energy and 1014 cm-2 fuence in n and p-type Hg0.78Cd0.22Te flms grown by molecular-beam epitaxy. A similarity in defect pattern...
| Published in: | Applied nanoscience Vol. 12, № 3. P. 395-401 |
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| Other Authors: | , , , , , , , , , , , |
| Format: | Article |
| Language: | English |
| Subjects: | |
| Online Access: | http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000927183 Перейти в каталог НБ ТГУ |