TEM studies of structural defects in HgTe/HgCdTe quantum wells

Bright-field and high-resolution transmission electron microscopy and microdiffraction have been used for the study of defects in two HgTe/HgCdTe single quantum well (QW) structures grown by molecular beam epitaxy on GaAs substrates with ZnTe and CdTe buffer layers. Defects in QW layers were identif...

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Bibliographic Details

Published in:	Applied nanoscience Vol. 10, № 8. P. 2867-2871
Other Authors:	Bonchyk, A. Yu, Savytskyy, Hrygory V., Świątek, Zbigniew, Morgiel, Y., Izhnin, Igor I., Voytsekhovskiy, Alexander V., Korotaev, Alexander G., Mynbaev, Karim D., Fitsych, Olena I., Varavin, Vasilii S., Dvoretsky, Sergei A., Mikhailov, Nikolay N., Yakushev, Maxim V.
Format:	Article
Language:	English
Subjects:	квантовые ямы структурные дефекты молекулярно-лучевая эпитаксия просвечивающая электронная микроскопия статьи в журналах
Online Access:	http://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000656168 Перейти в каталог НБ ТГУ